Equipment used
Sample Details
Analysis and Results
X-ray Photoelectron Spectroscopy (XPS)
The sample was mounted on a glass substrate using double tape. Three different spots per sample
were analyzed. Parameters were set as follows, X-Ray source: Monochromatic Al Kα (1486.6 eV), Spot
size: 900 μm. Survey scans and high resolution scans were collected with pass energies of 150 and 20
eV and with a step size of 1.0 and 0.05 eV. Detailed spectra processing was performed by Thermo
Avantage (5.982) software
Results
Name | Peak BE | Atomic % | Avg. % | ||
scan 1 | scan 2 | scan 3 | |||
01s | 532.02 | 28.68 | 28.16 | 26.86 | 27.9 |
C1s | 284.88 | 71.32 | 71.2 | 72.52 | 71.68 |
S2p | 168.24 | 0.00 | 0.64 | 0.62 | 0.42 |
C/2p | 0.00 | 0.00 | 0.00 | 0.00 | |
N1s | 0.00 | 0.00 | 0.00 | 0.00 |
More info and specs Graphene Oxide – TDS / Graphene-Oxide-MSDS